Analysis and characterization of variability in subthreshold source-coupled logic circuits

Analysis and characterization of variability in subthreshold source-coupled logic circuits

IEEE Transactions on Circuits and Systems I: Regular Papers

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Bibliographic Details
Main Authors: Shoaran, Mahsa, Tajalli, Armin, Alioto, Massimo Bruno, Schmid, Alexandre, Leblebici, Yusuf.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: Institute of Electrical and Electronics Engineers Inc. 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123471
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/123471

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