Strain-driven fractional spontaneous exchange bias in ferromagnetic/ antiferromagnetic thin films with composition-graded ferromagnetic layer

10.1063/1.4871284

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Bibliographic Details
Main Authors: Phuoc, N.N., Ong, C.K.
Other Authors: TEMASEK LABORATORIES
Format: Article
Published: 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/128952
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Institution: National University of Singapore