Atomic force microscopy (AFM) based nanopatterning and nanocharacterization

Atomic force microscopy (AFM) based nanopatterning and nanocharacterization

Ph.D

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Bibliographic Details
Main Author: CHUNG HONG JING
Other Authors: PHYSICS
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
Atomic force microscopy, nanopatterning, nanocharacterization, bias-assisted, force-assisted, cAFM
Online Access:http://scholarbank.nus.edu.sg/handle/10635/13045
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-130452017-10-21T09:32:54Z Atomic force microscopy (AFM) based nanopatterning and nanocharacterization CHUNG HONG JING PHYSICS WEE THYE SHEN, ANDREW XIE XIANNING Atomic force microscopy, nanopatterning, nanocharacterization, bias-assisted, force-assisted, cAFM Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:29:28Z 2010-04-08T10:29:28Z 2008-02-21 Thesis CHUNG HONG JING (2008-02-21). Atomic force microscopy (AFM) based nanopatterning and nanocharacterization. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/13045 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic Atomic force microscopy, nanopatterning, nanocharacterization, bias-assisted, force-assisted, cAFM
spellingShingle Atomic force microscopy, nanopatterning, nanocharacterization, bias-assisted, force-assisted, cAFM
CHUNG HONG JING
Atomic force microscopy (AFM) based nanopatterning and nanocharacterization
description Ph.D
author2 PHYSICS
author_facet PHYSICS
CHUNG HONG JING
format Theses and Dissertations
author CHUNG HONG JING
author_sort CHUNG HONG JING
title Atomic force microscopy (AFM) based nanopatterning and nanocharacterization
title_short Atomic force microscopy (AFM) based nanopatterning and nanocharacterization
title_full Atomic force microscopy (AFM) based nanopatterning and nanocharacterization
title_fullStr Atomic force microscopy (AFM) based nanopatterning and nanocharacterization
title_full_unstemmed Atomic force microscopy (AFM) based nanopatterning and nanocharacterization
title_sort atomic force microscopy (afm) based nanopatterning and nanocharacterization
publishDate 2010
url http://scholarbank.nus.edu.sg/handle/10635/13045
_version_ 1681078790550192128

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