A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution

Ph.D

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Bibliographic Details
Main Author:	AB RAZAK BIN CHANBASHA
Other Authors:	PHYSICS
Format:	Theses and Dissertations
Language:	English
Published:	2010
Subjects:	Ultralow-energy, SIMS, surface transient, depth resolution
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/13335
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-13335
record_format	dspace
spelling	sg-nus-scholar.10635-133352015-01-14T18:01:24Z A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution AB RAZAK BIN CHANBASHA PHYSICS WEE THYE SHEN, ANDREW Ultralow-energy, SIMS, surface transient, depth resolution Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:32:07Z 2010-04-08T10:32:07Z 2007-08-15 Thesis AB RAZAK BIN CHANBASHA (2007-08-15). A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/13335 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	Ultralow-energy, SIMS, surface transient, depth resolution
spellingShingle	Ultralow-energy, SIMS, surface transient, depth resolution AB RAZAK BIN CHANBASHA A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution
description	Ph.D
author2	PHYSICS
author_facet	PHYSICS AB RAZAK BIN CHANBASHA
format	Theses and Dissertations
author	AB RAZAK BIN CHANBASHA
author_sort	AB RAZAK BIN CHANBASHA
title	A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution
title_short	A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution
title_full	A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution
title_fullStr	A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution
title_full_unstemmed	A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution
title_sort	study of the effects of ultralow energy secondary ion mass spectrometry (sims) on surface transient and depth resolution
publishDate	2010
url	http://scholarbank.nus.edu.sg/handle/10635/13335
_version_	1681078840042979328

A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution

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