Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization
10.1016/j.apsusc.2017.09.135
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Elsevier: Applied Surface Science
2017
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sg-nus-scholar.10635-1373212024-04-04T02:33:20Z Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization YONG ZHIHUA Jiajun Linghu Shibo Xi Hui Ru Tan SHEN LEI Yang Ping Hui Kim Hui Jian Qing Cao Meng Lee Leek YIN XINMAO FENG YUAN PING Pan Jisheng CENTRE FOR QUANTUM TECHNOLOGIES/PHYSICS MECHANICAL ENGINEERING NANOSCIENCE AND NANOSCIENCE INITIATIVE SINGAPORE SYNCHROTRON LIGHT SOURCE TiO2 thin films Pulsed laser deposition (PLD) XPS (X-ray photoelectron spectroscopy) HRTEM EXAFS XRD diffraction Reciprocal space mapping RHEED RBS AFM (atomic force microscopy) DFT calculation 10.1016/j.apsusc.2017.09.135 Applied Surface Science 428 710-717 2017-11-08T02:00:50Z 2017-11-08T02:00:50Z 2018-01-15 Article YONG ZHIHUA, Jiajun Linghu, Shibo Xi, Hui Ru Tan, SHEN LEI, Yang Ping, Hui Kim Hui, Jian Qing Cao, Meng Lee Leek, YIN XINMAO, FENG YUAN PING, Pan Jisheng (2018-01-15). Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization. Applied Surface Science 428 : 710-717. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2017.09.135 01694332 http://scholarbank.nus.edu.sg/handle/10635/137321 000415227000088 en Attribution-NonCommercial-NoDerivatives 4.0 International http://creativecommons.org/licenses/by-nc-nd/4.0/ Elsevier: Applied Surface Science |
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TiO2 thin films Pulsed laser deposition (PLD) XPS (X-ray photoelectron spectroscopy) HRTEM EXAFS XRD diffraction Reciprocal space mapping RHEED RBS AFM (atomic force microscopy) DFT calculation |
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TiO2 thin films Pulsed laser deposition (PLD) XPS (X-ray photoelectron spectroscopy) HRTEM EXAFS XRD diffraction Reciprocal space mapping RHEED RBS AFM (atomic force microscopy) DFT calculation YONG ZHIHUA Jiajun Linghu Shibo Xi Hui Ru Tan SHEN LEI Yang Ping Hui Kim Hui Jian Qing Cao Meng Lee Leek YIN XINMAO FENG YUAN PING Pan Jisheng Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization |
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10.1016/j.apsusc.2017.09.135 |
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CENTRE FOR QUANTUM TECHNOLOGIES/PHYSICS |
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CENTRE FOR QUANTUM TECHNOLOGIES/PHYSICS YONG ZHIHUA Jiajun Linghu Shibo Xi Hui Ru Tan SHEN LEI Yang Ping Hui Kim Hui Jian Qing Cao Meng Lee Leek YIN XINMAO FENG YUAN PING Pan Jisheng |
format |
Article |
author |
YONG ZHIHUA Jiajun Linghu Shibo Xi Hui Ru Tan SHEN LEI Yang Ping Hui Kim Hui Jian Qing Cao Meng Lee Leek YIN XINMAO FENG YUAN PING Pan Jisheng |
author_sort |
YONG ZHIHUA |
title |
Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization |
title_short |
Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization |
title_full |
Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization |
title_fullStr |
Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization |
title_full_unstemmed |
Ti1-xSnxO2 Nanofilms:Layer-by-layer Deposition with extended Sn solubility and Characterization |
title_sort |
ti1-xsnxo2 nanofilms:layer-by-layer deposition with extended sn solubility and characterization |
publisher |
Elsevier: Applied Surface Science |
publishDate |
2017 |
url |
http://scholarbank.nus.edu.sg/handle/10635/137321 |
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1800913157153095680 |