Data selection for noise robust exemplar matching

10.1109/ICASSP.2016.7472825

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Bibliographic Details
Main Authors: Yilmaz E., Gemmeke J.F., Van Hamme H.
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: Institute of Electrical and Electronics Engineers Inc. 2018
Online Access:http://scholarbank.nus.edu.sg/handle/10635/145623
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Institution: National University of Singapore