Noise robust exemplar matching with alpha-beta divergence

10.1016/j.specom.2015.10.004

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Bibliographic Details
Main Authors: Yilmaz E., Gemmeke J.F., Van Hamme H.
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Article
Published: Elsevier 2018
Online Access:http://scholarbank.nus.edu.sg/handle/10635/145624
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Institution: National University of Singapore
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Summary:10.1016/j.specom.2015.10.004