HA, V. N. T., & ALLIANCE, S. (2019). C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR).
Chicago Style CitationHA, VU NGUYEN TUAN, and SINGAPORE-MIT ALLIANCE. C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR). 2019.
MLA引文HA, VU NGUYEN TUAN, and SINGAPORE-MIT ALLIANCE. C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR). 2019.
警告：這些引文格式不一定是100％准確.