C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR)

Master's

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Bibliographic Details
Main Author: VU NGUYEN TUAN HA
Other Authors: SINGAPORE-MIT ALLIANCE
Format: Theses and Dissertations
Published: 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/153956
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Institution: National University of Singapore