C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR)

C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR)

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Bibliographic Details
Main Author:	VU NGUYEN TUAN HA
Other Authors:	SINGAPORE-MIT ALLIANCE
Format:	Theses and Dissertations
Published:	2019
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/153956
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Institution:	National University of Singapore

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