C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR)
Master's
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2019
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sg-nus-scholar.10635-1539562024-10-26T00:11:37Z C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR) VU NGUYEN TUAN HA SINGAPORE-MIT ALLIANCE LEE JAE GON TAN CHUNG FOONG PEY KIN LEONG Master's MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS Supervisors: 1. Dr. Lee Jae Gon, Chartered Semiconductor Manufacturing Ltd., 2. Dr. Tan Chung Foong, Chartered Semiconductor Manufacturing Ltd., 3. Prof. Pey Kin Leong, Nanyang Technological University. 2019-05-10T04:54:17Z 2019-05-10T04:54:17Z 2008 Thesis VU NGUYEN TUAN HA (2008). C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR). ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/153956 SMA BATCHLOAD 20190422 |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Master's |
| author2 |
SINGAPORE-MIT ALLIANCE |
| author_facet |
SINGAPORE-MIT ALLIANCE VU NGUYEN TUAN HA |
| format |
Theses and Dissertations |
| author |
VU NGUYEN TUAN HA |
| spellingShingle |
VU NGUYEN TUAN HA C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR) |
| author_sort |
VU NGUYEN TUAN HA |
| title |
C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR) |
| title_short |
C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR) |
| title_full |
C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR) |
| title_fullStr |
C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR) |
| title_full_unstemmed |
C-V MEASUREMENTS OF ULTRA THIN GATE MOSFETS (METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR) |
| title_sort |
c-v measurements of ultra thin gate mosfets (metal-oxide-semiconductor field-effect transistor) |
| publishDate |
2019 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/153956 |
| _version_ |
1821197652244561920 |