ANTO, E., & ALLIANCE, S. (2019). DEVELOPMENT OF DROP-TEST SIMULATION AND RELIABILITY CHARACTERIZATION FOR IC PACKAGES.
Chicago Style CitationANTO, EDI, and SINGAPORE-MIT ALLIANCE. DEVELOPMENT OF DROP-TEST SIMULATION AND RELIABILITY CHARACTERIZATION FOR IC PACKAGES. 2019.
MLA引文ANTO, EDI, and SINGAPORE-MIT ALLIANCE. DEVELOPMENT OF DROP-TEST SIMULATION AND RELIABILITY CHARACTERIZATION FOR IC PACKAGES. 2019.
警告:這些引文格式不一定是100%准確.