DEVELOPMENT OF DROP-TEST SIMULATION AND RELIABILITY CHARACTERIZATION FOR IC PACKAGES

Master's

Saved in:
Bibliographic Details
Main Author: EDI ANTO
Other Authors: SINGAPORE-MIT ALLIANCE
Format: Theses and Dissertations
Published: 2019
Subjects:
BGA
SMD
Online Access:https://scholarbank.nus.edu.sg/handle/10635/154135
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore