A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE

Master's

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Bibliographic Details
Main Author: XU ZHEN
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Theses and Dissertations
Published: 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/158710
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Institution: National University of Singapore
id sg-nus-scholar.10635-158710
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spelling sg-nus-scholar.10635-1587102019-09-16T13:09:56Z A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE XU ZHEN DEPT OF ELECTRICAL & COMPUTER ENGG BYUNG JIN CHO MING FU LI Master's MASTER OF ENGINEERING 2019-09-16T02:35:43Z 2019-09-16T02:35:43Z 2001 Thesis XU ZHEN (2001). A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/158710 CCK BATCHLOAD 20190911
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Master's
author2 DEPT OF ELECTRICAL & COMPUTER ENGG
author_facet DEPT OF ELECTRICAL & COMPUTER ENGG
XU ZHEN
format Theses and Dissertations
author XU ZHEN
spellingShingle XU ZHEN
A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE
author_sort XU ZHEN
title A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE
title_short A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE
title_full A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE
title_fullStr A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE
title_full_unstemmed A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE
title_sort study of the quasi-breakdown mechanism in ultra-thin gate oxide
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/158710
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