ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES

Master's

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Bibliographic Details
Main Author: SIM SZE KUAN
Other Authors: PHYSICS
Format: Theses and Dissertations
Published: 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/158713
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Institution: National University of Singapore
id sg-nus-scholar.10635-158713
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spelling sg-nus-scholar.10635-1587132024-04-17T09:45:42Z ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES SIM SZE KUAN PHYSICS ONG CHONG KIM Master's MASTER OF SCIENCE 2019-09-16T02:35:49Z 2019-09-16T02:35:49Z 1999 Thesis SIM SZE KUAN (1999). ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/158713 CCK BATCHLOAD 20190911
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 PHYSICS
author_facet PHYSICS
SIM SZE KUAN
format Theses and Dissertations
author SIM SZE KUAN
spellingShingle SIM SZE KUAN
ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES
author_sort SIM SZE KUAN
title ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES
title_short ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES
title_full ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES
title_fullStr ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES
title_full_unstemmed ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES
title_sort electromigration in yba2cu3o7-8 microbridges
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/158713
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