A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE

Master's

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Bibliographic Details
Main Author: XU ZHEN
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Theses and Dissertations
Published: 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/160024
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Institution: National University of Singapore
Description
Summary:Master's