ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE

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Main Author:	SIM KIAN SIN
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/169062
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-169062
record_format	dspace
spelling	sg-nus-scholar.10635-1690622020-11-19T13:57:12Z ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE SIM KIAN SIN ELECTRICAL ENGINEERING JCH PANG DSH CHAN Master's MASTER OF ENGINEERING 2020-06-03T08:17:01Z 2020-06-03T08:17:01Z 1991 Thesis SIM KIAN SIN (1991). ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/169062 CCK BATCHLOAD 20200605
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING SIM KIAN SIN
format	Theses and Dissertations
author	SIM KIAN SIN
spellingShingle	SIM KIAN SIN ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE
author_sort	SIM KIAN SIN
title	ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE
title_short	ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE
title_full	ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE
title_fullStr	ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE
title_full_unstemmed	ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE
title_sort	electron beam testing of integrated circuits using a modified scanning electron microscope
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/169062
_version_	1686108701823336448

ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS USING A MODIFIED SCANNING ELECTRON MICROSCOPE

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