Stacking sequence determines Raman intensities of observed interlayer shear modes in 2D layered materials - A general bond polarizability model
10.1038/srep14565
Saved in:
Main Authors: | Luo, Xin, Lu, Xin, Cong, Chunxiao, Yu, Ting, Xiong, Qihua, Quek, Su Ying |
---|---|
Other Authors: | CENTRE FOR ADVANCED 2D MATERIALS |
Format: | Article |
Language: | English |
Published: |
NATURE PUBLISHING GROUP
2020
|
Subjects: | |
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/170915 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Language: | English |
Similar Items
-
Unravelling strong electronic interlayer and intralayer correlations in a transition metal dichalcogenide
by: Whitcher, TJ, et al.
Published: (2022) -
Rapid and Nondestructive Identification of Polytypism and Stacking Sequences in Few-Layer Molybdenum Diselenide by Raman Spectroscopy
by: Lu, Xin, et al.
Published: (2020) -
Effects of lower symmetry and dimensionality on Raman spectra in two-dimensional WSe2
by: Luo, Xin, et al.
Published: (2020) -
Stacking sequence determines Raman intensities of observed interlayer shear modes in 2D layered materials – A general bond polarizability model
by: Luo, Xin, et al.
Published: (2015) -
Anomalous frequency trends in MoS2 thin films attributed to surface effects
by: Luo, Xin, et al.
Published: (2020)