Winding Fault Detection in Coupled Inductors using a Single Flux Sensor

• Main Authors: Chandar, Subash A, Panda, Sanjib Kumar, Nadarajan, Sivakumar, Gupta, Amit Kumar
• Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: IEEE 2020
• Subjects: Science & Technology; Technology; Engineering, Electrical & Electronic; Engineering; Coupled inductor; Winding fault; Leakage flux; Yoke; TRANSFORMERS
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/171897
• Institution: National University of Singapore

10.1109/IECON.2016.7793934