Inter-turn Fault Detection of Induction Machines Using the Voltage Across the Star-points of the Machine and the Source
10.1109/PEDS44367.2019.8998765
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Main Authors: | Athikessavan, SC, Panda, SK |
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Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
IEEE
2020
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/171903 |
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Institution: | National University of Singapore |
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