PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS

Master's

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Main Author: GE LI XIN
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/172335
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1723352020-11-19T13:57:13Z PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS GE LI XIN ELECTRICAL ENGINEERING JACOB PHANG CHEE HONG CHIM WAI KIN Master's MASTER OF ENGINEERING 2020-08-11T10:12:21Z 2020-08-11T10:12:21Z 1997 Thesis GE LI XIN (1997). PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/172335 CCK BATCHLOAD 20200814
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
GE LI XIN
format Theses and Dissertations
author GE LI XIN
spellingShingle GE LI XIN
PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS
author_sort GE LI XIN
title PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS
title_short PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS
title_full PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS
title_fullStr PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS
title_full_unstemmed PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS
title_sort photon emission microscope systems for integrated circuit failure analysis
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/172335
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