PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS
Master's
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sg-nus-scholar.10635-1723352020-11-19T13:57:13Z PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS GE LI XIN ELECTRICAL ENGINEERING JACOB PHANG CHEE HONG CHIM WAI KIN Master's MASTER OF ENGINEERING 2020-08-11T10:12:21Z 2020-08-11T10:12:21Z 1997 Thesis GE LI XIN (1997). PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/172335 CCK BATCHLOAD 20200814 |
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National University of Singapore |
building |
NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
description |
Master's |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING GE LI XIN |
format |
Theses and Dissertations |
author |
GE LI XIN |
spellingShingle |
GE LI XIN PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS |
author_sort |
GE LI XIN |
title |
PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS |
title_short |
PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS |
title_full |
PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS |
title_fullStr |
PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS |
title_full_unstemmed |
PHOTON EMISSION MICROSCOPE SYSTEMS FOR INTEGRATED CIRCUIT FAILURE ANALYSIS |
title_sort |
photon emission microscope systems for integrated circuit failure analysis |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/172335 |
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1686108818329567232 |