Thickness dependence of spin Hall magnetoresistance in FeMn/Pt bilayers

10.1063/1.4953396

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Bibliographic Details
Main Authors: Yang, Y, Xu, Y, Yao, K, Wu, Y
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: 2020
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Online Access:https://scholarbank.nus.edu.sg/handle/10635/174625
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Institution: National University of Singapore
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Summary:10.1063/1.4953396