All the self-testings of the singlet for two binary measurements

10.1088/1367-2630/18/2/025021

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Bibliographic Details
Main Authors: Wang, Y, Wu, X, Scarani, V
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: Institute of Physics Publishing 2020
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/175263
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Institution: National University of Singapore
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