INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD

Master's

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Bibliographic Details
Main Author:	NG KOK HOOI
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/175846
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-175846
record_format	dspace
spelling	sg-nus-scholar.10635-1758462020-11-19T13:57:15Z INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD NG KOK HOOI ELECTRICAL ENGINEERING LI MING FU CHIM WAI KIN Master's MASTER OF ENGINEERING 2020-09-11T04:38:03Z 2020-09-11T04:38:03Z 1999 Thesis NG KOK HOOI (1999). INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/175846 CCK BATCHLOAD 20200918
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING NG KOK HOOI
format	Theses and Dissertations
author	NG KOK HOOI
spellingShingle	NG KOK HOOI INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD
author_sort	NG KOK HOOI
title	INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD
title_short	INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD
title_full	INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD
title_fullStr	INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD
title_full_unstemmed	INVESTIGATION OF HOT-CARRIER-INDUCED INTERFACE-TRAPS BY DCIV METHOD
title_sort	investigation of hot-carrier-induced interface-traps by dciv method
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/175846
_version_	1686108915489570816

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