Device Feature Extraction Based on Parallel Neural Network Training for Replay Spoofing Detection

Device Feature Extraction Based on Parallel Neural Network Training for Replay Spoofing Detection

10.1109/TASLP.2020.3011320

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Bibliographic Details
Main Author: YANG JICHEN
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: Institute of Electrical and Electronics Engineers Inc. 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/177208
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Institution: National University of Singapore
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