CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS

Ph.D

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Bibliographic Details
Main Author:	ANG DIING SHENP
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/177858
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-177858
record_format	dspace
spelling	sg-nus-scholar.10635-1778582020-11-19T13:57:16Z CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS ANG DIING SHENP ELECTRICAL ENGINEERING C.H. LING Ph.D DOCTOR OF PHILOSOPHY 2020-10-20T03:49:42Z 2020-10-20T03:49:42Z 1997 Thesis ANG DIING SHENP (1997). CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/177858 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Ph.D
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING ANG DIING SHENP
format	Theses and Dissertations
author	ANG DIING SHENP
spellingShingle	ANG DIING SHENP CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS
author_sort	ANG DIING SHENP
title	CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS
title_short	CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS
title_full	CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS
title_fullStr	CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS
title_full_unstemmed	CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS
title_sort	characterization of hot-carrier degradation in submicrometer mos transistors
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/177858
_version_	1686108957148446720

CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS

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