Detecting Thermal Cloaks via Transient Effects

10.1038/srep32915

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Bibliographic Details
Main Authors: Sklan, S.R, Bai, X, Li, B, Zhang, X
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: 2020
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/178865
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Institution: National University of Singapore