Sklan, S., Bai, X., Li, B., Zhang, X., & ENGINEERING, E. A. C. (2020). Detecting Thermal Cloaks via Transient Effects.
Chicago Style CitationSklan, S.R, X. Bai, B. Li, X. Zhang, and ELECTRICAL AND COMPUTER ENGINEERING. Detecting Thermal Cloaks Via Transient Effects. 2020.
MLA引文Sklan, S.R, et al. Detecting Thermal Cloaks Via Transient Effects. 2020.
警告:這些引文格式不一定是100%准確.