SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY

Ph.D

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Bibliographic Details
Main Author:	KOLACHINA SIVARAMAKRISHNA
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/179129
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-179129
record_format	dspace
spelling	sg-nus-scholar.10635-1791292024-10-27T02:18:30Z SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY KOLACHINA SIVARAMAKRISHNA ELECTRICAL ENGINEERING JACOB PHANG DANIEL CHAN Ph.D DOCTOR OF PHILOSOPHY 2020-10-22T09:37:36Z 2020-10-22T09:37:36Z 1998 Thesis KOLACHINA SIVARAMAKRISHNA (1998). SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/179129 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Ph.D
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING KOLACHINA SIVARAMAKRISHNA
format	Theses and Dissertations
author	KOLACHINA SIVARAMAKRISHNA
spellingShingle	KOLACHINA SIVARAMAKRISHNA SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY
author_sort	KOLACHINA SIVARAMAKRISHNA
title	SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY
title_short	SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY
title_full	SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY
title_fullStr	SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY
title_full_unstemmed	SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY
title_sort	single contact phenomena in beam induced current microscopy
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/179129
_version_	1821233420627345408

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