COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR

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Bibliographic Details
Main Author:	HU PEH YIN
Other Authors:	PHYSICS
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/179687
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-179687
record_format	dspace
spelling	sg-nus-scholar.10635-1796872024-04-17T09:54:51Z COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR HU PEH YIN PHYSICS H.S. TAN S.C. NG Master's MASTER OF SCIENCE 2020-10-23T08:53:01Z 2020-10-23T08:53:01Z 1993 Thesis HU PEH YIN (1993). COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/179687 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	PHYSICS
author_facet	PHYSICS HU PEH YIN
format	Theses and Dissertations
author	HU PEH YIN
spellingShingle	HU PEH YIN COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR
author_sort	HU PEH YIN
title	COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR
title_short	COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR
title_full	COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR
title_fullStr	COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR
title_full_unstemmed	COPPER-INDUCED DEEP LEVEL DEFECTS IN GAAS[0.6]P[0.4] ALLOY SEMICONDUCTOR
title_sort	copper-induced deep level defects in gaas[0.6]p[0.4] alloy semiconductor
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/179687
_version_	1800914565037293568

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