COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS

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Bibliographic Details
Main Author:	WU ZONGMIN
Other Authors:	PHYSICS
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/180533
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-180533
record_format	dspace
spelling	sg-nus-scholar.10635-1805332024-04-17T09:54:50Z COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS WU ZONGMIN PHYSICS TAN HOCK SIEW NG SER CHOON Master's MASTER OF SCIENCE 2020-10-26T09:52:06Z 2020-10-26T09:52:06Z 1997 Thesis WU ZONGMIN (1997). COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/180533 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	PHYSICS
author_facet	PHYSICS WU ZONGMIN
format	Theses and Dissertations
author	WU ZONGMIN
spellingShingle	WU ZONGMIN COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS
author_sort	WU ZONGMIN
title	COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS
title_short	COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS
title_full	COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS
title_fullStr	COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS
title_full_unstemmed	COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS
title_sort	computer controlled transient capacitance measurement and analysis of deep levels in semiconductors
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/180533
_version_	1800914598844432384

COMPUTER CONTROLLED TRANSIENT CAPACITANCE MEASUREMENT AND ANALYSIS OF DEEP LEVELS IN SEMICONDUCTORS

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