Quantum metrology with open dynamical systems

Quantum metrology with open dynamical systems

10.1088/1367-2630/15/7/073005

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Bibliographic Details
Main Author: Tsang, M
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: 2020
Subjects:
Arbitrary quantum state
Force sensing
Open dynamical systems
Optical phase
Optomechanical
Quantum detection
Quantum metrology
Realistic conditions
Dynamical systems
Quantum optics
Quantum theory
Online Access:https://scholarbank.nus.edu.sg/handle/10635/180791
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Institution: National University of Singapore
Description
Summary:10.1088/1367-2630/15/7/073005

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