A new mirroring circuit for power MOS current sensing highly immune to EMI

• Main Authors: Aiello, O, Fiori, F
• Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
• Format: Article
• Published: 2020
• Subjects: Current sensing; Current sensors; Integrated currents; Miller effects; Power transistors; Radio frequency interference; SenseFET; Smart power; CMOS integrated circuits; Computer simulation; Electromagnetic compatibility; Electromagnetic pulse; Power electronics; Sensors; Signal interference; Transistors; Drain current
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/180802
• Institution: National University of Singapore

10.3390/s130201856