A new mirroring circuit for power MOS current sensing highly immune to EMI

• Main Authors: Aiello, O, Fiori, F
• 其他作者: ELECTRICAL AND COMPUTER ENGINEERING
• 格式: Article
• 出版: 2020
• 主題: Current sensing; Current sensors; Integrated currents; Miller effects; Power transistors; Radio frequency interference; SenseFET; Smart power; CMOS integrated circuits; Computer simulation; Electromagnetic compatibility; Electromagnetic pulse; Power electronics; Sensors; Signal interference; Transistors; Drain current
• 在線閱讀: https://scholarbank.nus.edu.sg/handle/10635/180802

10.3390/s130201856