MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS

Master's

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Bibliographic Details
Main Author:	SEAH BOON PIAN
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/182150
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-182150
record_format	dspace
spelling	sg-nus-scholar.10635-1821502020-11-19T13:57:20Z MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS SEAH BOON PIAN ELECTRICAL ENGINEERING LING CHUNG HO SAMUDRA GANESH S Master's MASTER OF ENGINEERING 2020-10-30T06:36:38Z 2020-10-30T06:36:38Z 1996 Thesis SEAH BOON PIAN (1996). MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/182150 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING SEAH BOON PIAN
format	Theses and Dissertations
author	SEAH BOON PIAN
spellingShingle	SEAH BOON PIAN MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS
author_sort	SEAH BOON PIAN
title	MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS
title_short	MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS
title_full	MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS
title_fullStr	MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS
title_full_unstemmed	MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS
title_sort	modelling and simulating of hot-carrier degradation in submicrometre mos transistors
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/182150
_version_	1686109157370888192

MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS

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