AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES

Ph.D

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Bibliographic Details
Main Author: VINCENT ONG KENG SIAN
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/182247
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1822472020-11-19T13:57:20Z AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES VINCENT ONG KENG SIAN ELECTRICAL ENGINEERING JACOB PHANG CHEE HONG DANIEL CHAN SIU HUNG Ph.D DOCTOR OF PHILOSOPHY 2020-10-30T06:42:55Z 2020-10-30T06:42:55Z 1997 Thesis VINCENT ONG KENG SIAN (1997). AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/182247 CCK BATCHLOAD 20201023
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Ph.D
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
VINCENT ONG KENG SIAN
format Theses and Dissertations
author VINCENT ONG KENG SIAN
spellingShingle VINCENT ONG KENG SIAN
AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
author_sort VINCENT ONG KENG SIAN
title AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
title_short AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
title_full AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
title_fullStr AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
title_full_unstemmed AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
title_sort investigation into the electron beam induced current effects on semiconductor materials and devices
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/182247
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