AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES
Ph.D
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Theses and Dissertations |
Published: |
2020
|
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/182247 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-182247 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-1822472020-11-19T13:57:20Z AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES VINCENT ONG KENG SIAN ELECTRICAL ENGINEERING JACOB PHANG CHEE HONG DANIEL CHAN SIU HUNG Ph.D DOCTOR OF PHILOSOPHY 2020-10-30T06:42:55Z 2020-10-30T06:42:55Z 1997 Thesis VINCENT ONG KENG SIAN (1997). AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/182247 CCK BATCHLOAD 20201023 |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
Ph.D |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING VINCENT ONG KENG SIAN |
format |
Theses and Dissertations |
author |
VINCENT ONG KENG SIAN |
spellingShingle |
VINCENT ONG KENG SIAN AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES |
author_sort |
VINCENT ONG KENG SIAN |
title |
AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES |
title_short |
AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES |
title_full |
AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES |
title_fullStr |
AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES |
title_full_unstemmed |
AN INVESTIGATION INTO THE ELECTRON BEAM INDUCED CURRENT EFFECTS ON SEMICONDUCTOR MATERIALS AND DEVICES |
title_sort |
investigation into the electron beam induced current effects on semiconductor materials and devices |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/182247 |
_version_ |
1686109172042563584 |