RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING
Master's
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| Format: | Theses and Dissertations |
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2020
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/182791 |
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sg-nus-scholar.10635-1827912020-11-19T13:57:20Z RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING TEH GIM LEONG ELECTRICAL ENGINEERING CHIM WAI KIN Master's MASTER OF ENGINEERING 2020-11-06T09:07:57Z 2020-11-06T09:07:57Z 1998 Thesis TEH GIM LEONG (1998). RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/182791 CCK BATCHLOAD 20201113 |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Master's |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING TEH GIM LEONG |
| format |
Theses and Dissertations |
| author |
TEH GIM LEONG |
| spellingShingle |
TEH GIM LEONG RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING |
| author_sort |
TEH GIM LEONG |
| title |
RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING |
| title_short |
RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING |
| title_full |
RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING |
| title_fullStr |
RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING |
| title_full_unstemmed |
RELIABILITY INVESTIGATION OF MOS DEVICES UNDER HIGH CURRENT IMPULSE STRESSING |
| title_sort |
reliability investigation of mos devices under high current impulse stressing |
| publishDate |
2020 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/182791 |
| _version_ |
1686109207205511168 |