TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS

Master's

Saved in:
Bibliographic Details
Main Author: POON FOOK WENG
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/182834
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-182834
record_format dspace
spelling sg-nus-scholar.10635-1828342021-02-15T01:19:57Z TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS POON FOOK WENG ELECTRICAL ENGINEERING CHOI WEE KIONG Master's MASTER OF ENGINEERING 2020-11-06T09:10:06Z 2020-11-06T09:10:06Z 1997 Thesis POON FOOK WENG (1997). TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/182834 CCK BATCHLOAD 20201113
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
POON FOOK WENG
format Theses and Dissertations
author POON FOOK WENG
spellingShingle POON FOOK WENG
TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
author_sort POON FOOK WENG
title TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_short TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_full TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_fullStr TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_full_unstemmed TUNNELLING PHENOMENA IN RAPID THERMAL ANNEALED SILICON : SILICON OXIDE SYSTEMS
title_sort tunnelling phenomena in rapid thermal annealed silicon : silicon oxide systems
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/182834
_version_ 1692007238612287488