Toward error-free scaled spin torque majority gates

• Main Authors: Vaysset, A, Manfrini, M, Nikonov, D.E, Manipatruni, S, Young, I.A, Pourtois, G, Radu, I.P, Thean, A
• Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
• Format: Article
• Published: 2020
• Subjects: Critical size; Domain wall width; Energy landscape; Majority gates; Material parameter; Micromagnetic simulations; Operating condition; Spin torque
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/183332
• Institution: National University of Singapore

10.1063/1.4953672