Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants

10.1063/1.4977498

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Bibliographic Details
Main Authors:	Woo, T, Kim, D, Someya, T, Sekino, M
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Published:	American Institute of Physics 2020
Subjects:	Image resolution Numerical models Accurate quantifications Compensation factor Electrical conductivity Field inhomogeneity Quantitative diagnosis Selective excitations Signal inhomogeneity Spatial resolution Magnetic resonance imaging
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/183529
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-183529
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spelling	sg-nus-scholar.10635-1835292024-04-16T12:14:15Z Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants Woo, T Kim, D Someya, T Sekino, M ELECTRICAL AND COMPUTER ENGINEERING Image resolution Numerical models Accurate quantifications Compensation factor Electrical conductivity Field inhomogeneity Quantitative diagnosis Selective excitations Signal inhomogeneity Spatial resolution Magnetic resonance imaging 10.1063/1.4977498 AIP Advances 7 5 56726 2020-11-17T06:32:35Z 2020-11-17T06:32:35Z 2017 Article Woo, T, Kim, D, Someya, T, Sekino, M (2017). Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants. AIP Advances 7 (5) : 56726. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4977498 2158-3226 https://scholarbank.nus.edu.sg/handle/10635/183529 Attribution 4.0 International http://creativecommons.org/licenses/by/4.0/ American Institute of Physics Unpaywall 20201031
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Image resolution Numerical models Accurate quantifications Compensation factor Electrical conductivity Field inhomogeneity Quantitative diagnosis Selective excitations Signal inhomogeneity Spatial resolution Magnetic resonance imaging
spellingShingle	Image resolution Numerical models Accurate quantifications Compensation factor Electrical conductivity Field inhomogeneity Quantitative diagnosis Selective excitations Signal inhomogeneity Spatial resolution Magnetic resonance imaging Woo, T Kim, D Someya, T Sekino, M Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants
description	10.1063/1.4977498
author2	ELECTRICAL AND COMPUTER ENGINEERING
author_facet	ELECTRICAL AND COMPUTER ENGINEERING Woo, T Kim, D Someya, T Sekino, M
format	Article
author	Woo, T Kim, D Someya, T Sekino, M
author_sort	Woo, T
title	Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants
title_short	Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants
title_full	Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants
title_fullStr	Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants
title_full_unstemmed	Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants
title_sort	spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for mri of objects containing conductive implants
publisher	American Institute of Physics
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/183529
_version_	1800914704658333696

Spatial resolution and maximum compensation factor of two-dimensional selective excitation pulses for MRI of objects containing conductive implants

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