APA استشهاد

Chang, T., Chang, C., Huang, C., Liang, Y., Samudra, G., Lin, R., & ENGINEERING, E. A. C. (2020). Study on trapping effects in AlGaN/GaN-on-Si devices with vertical interconnect structures. Electrochemical Society.

استشهاد بنمط شيكاغو

Chang, T.-F, C.-Y Chang, C.-F Huang, Y.C Liang, G.S Samudra, R.-M Lin, و ELECTRICAL AND COMPUTER ENGINEERING. Study On Trapping Effects in AlGaN/GaN-on-Si Devices With Vertical Interconnect Structures. Electrochemical Society, 2020.

MLA استشهاد

Chang, T.-F, et al. Study On Trapping Effects in AlGaN/GaN-on-Si Devices With Vertical Interconnect Structures. Electrochemical Society, 2020.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.