JIAN, Y., & ENGINEERING, E. &. C. (2011). Dopant profile extraction and dielectric characterization using scanning capacitance microscopy.
استشهاد بنمط شيكاغوJIAN, YAN, و ELECTRICAL & COMPUTER ENGINEERING. Dopant Profile Extraction and Dielectric Characterization Using Scanning Capacitance Microscopy. 2011.
MLA استشهادJIAN, YAN, و ELECTRICAL & COMPUTER ENGINEERING. Dopant Profile Extraction and Dielectric Characterization Using Scanning Capacitance Microscopy. 2011.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.