APA Citation

JIAN, Y., & ENGINEERING, E. &. C. (2011). Dopant profile extraction and dielectric characterization using scanning capacitance microscopy.

Chicago Style Citation

JIAN, YAN, and ELECTRICAL & COMPUTER ENGINEERING. Dopant Profile Extraction and Dielectric Characterization Using Scanning Capacitance Microscopy. 2011.

MLA Citation

JIAN, YAN, and ELECTRICAL & COMPUTER ENGINEERING. Dopant Profile Extraction and Dielectric Characterization Using Scanning Capacitance Microscopy. 2011.

Warning: These citations may not always be 100% accurate.