APA引文

JIAN, Y., & ENGINEERING, E. &. C. (2011). Dopant profile extraction and dielectric characterization using scanning capacitance microscopy.

Chicago Style Citation

JIAN, YAN, and ELECTRICAL & COMPUTER ENGINEERING. Dopant Profile Extraction and Dielectric Characterization Using Scanning Capacitance Microscopy. 2011.

MLA引文

JIAN, YAN, and ELECTRICAL & COMPUTER ENGINEERING. Dopant Profile Extraction and Dielectric Characterization Using Scanning Capacitance Microscopy. 2011.

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