Reliability Assessment of High-Quality New Products with Data Scarcity

10.1080/00207543.2020.1758355

Saved in:
Bibliographic Details
Main Authors: Cai Wen Zhang, Rong Pan, THONG NGEE GOH
Other Authors: INDUSTRIAL SYSTEMS ENGINEERING AND MANAGEMENT
Format: Article
Published: Taylor & Francis 2021
Online Access:https://scholarbank.nus.edu.sg/handle/10635/194490
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items