Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method

Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method

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Main Authors: SIPING GAO, IURII CHERUKHIN, YONGXIN GUO
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: IEEE 2021
Online Access:https://scholarbank.nus.edu.sg/handle/10635/202049
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-2020492024-11-13T02:57:13Z Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method SIPING GAO IURII CHERUKHIN YONGXIN GUO ELECTRICAL AND COMPUTER ENGINEERING 2021-10-06T08:46:27Z 2021-10-06T08:46:27Z 2021-10-04 Article SIPING GAO, IURII CHERUKHIN, YONGXIN GUO (2021-10-04). Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/202049 Attribution-NonCommercial-NoDerivatives 4.0 International http://creativecommons.org/licenses/by-nc-nd/4.0/ IEEE
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
author2 ELECTRICAL AND COMPUTER ENGINEERING
author_facet ELECTRICAL AND COMPUTER ENGINEERING
SIPING GAO
IURII CHERUKHIN
YONGXIN GUO
format Article
author SIPING GAO
IURII CHERUKHIN
YONGXIN GUO
spellingShingle SIPING GAO
IURII CHERUKHIN
YONGXIN GUO
Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method
author_sort SIPING GAO
title Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method
title_short Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method
title_full Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method
title_fullStr Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method
title_full_unstemmed Characterizing Microwave Connectors over Temperature: Thermal-stable Standards and Characterization Method
title_sort characterizing microwave connectors over temperature: thermal-stable standards and characterization method
publisher IEEE
publishDate 2021
url https://scholarbank.nus.edu.sg/handle/10635/202049
_version_ 1821183918804566016

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