Robust polarimetric SAR imaging method with attributed scattering characterization

10.1109/ACCESS.2019.2912035

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Bibliographic Details
Main Authors: Yang, Y., Gui, G., Hu, R., Zhang, X., Cong, X., Wan, Q.
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: Institute of Electrical and Electronics Engineers Inc. 2021
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/206400
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Institution: National University of Singapore
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