Size effect on memristive properties of nanocrystalline ZnO film for resistive synaptic devices

Size effect on memristive properties of nanocrystalline ZnO film for resistive synaptic devices

10.1088/1742-6596/1124/8/081036

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Bibliographic Details
Main Authors: Shandyba, N.A., Panchenko, I.V., Tominov, R.V., Smirnov, V.A., Pelipenko, M.I., Zamburg, E.G., Chu, Y.H.
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: Institute of Physics Publishing 2021
Online Access:https://scholarbank.nus.edu.sg/handle/10635/206491
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Institution: National University of Singapore
Description
Summary:10.1088/1742-6596/1124/8/081036

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