DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION

Ph.D

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Bibliographic Details
Main Author:	ZENG QIBIN
Other Authors:	MECHANICAL ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2021
Subjects:	Scanning probe microscopy, multi-frequency, piezoelectric and ferroelectric, surface strain, surface potential, nanoscale characterization
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/207619
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-207619
record_format	dspace
spelling	sg-nus-scholar.10635-2076192023-05-30T18:00:18Z DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION ZENG QIBIN MECHANICAL ENGINEERING Kaiyang Zeng Scanning probe microscopy, multi-frequency, piezoelectric and ferroelectric, surface strain, surface potential, nanoscale characterization Ph.D DOCTOR OF PHILOSOPHY (CDE-ENG) 2021-11-23T18:00:25Z 2021-11-23T18:00:25Z 2021-08-12 Thesis ZENG QIBIN (2021-08-12). DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/207619 0000-0001-9307-0830 en
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	Scanning probe microscopy, multi-frequency, piezoelectric and ferroelectric, surface strain, surface potential, nanoscale characterization
spellingShingle	Scanning probe microscopy, multi-frequency, piezoelectric and ferroelectric, surface strain, surface potential, nanoscale characterization ZENG QIBIN DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION
description	Ph.D
author2	MECHANICAL ENGINEERING
author_facet	MECHANICAL ENGINEERING ZENG QIBIN
format	Theses and Dissertations
author	ZENG QIBIN
author_sort	ZENG QIBIN
title	DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION
title_short	DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION
title_full	DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION
title_fullStr	DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION
title_full_unstemmed	DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION
title_sort	development of advanced multi-frequency scanning probe microscopies for nanoscale physical properties characterization
publishDate	2021
url	https://scholarbank.nus.edu.sg/handle/10635/207619
_version_	1770562817037959168

DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION

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