ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM

Ph.D

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Main Author:	FANG HANYAN
Other Authors:	CHEMISTRY
Format:	Theses and Dissertations
Language:	English
Published:	2021
Subjects:	2D semiconductor, scanning tunneling microscopy, non-contact atomic microscopy, single vacancy, vacancy cluster, domain boundary
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/208660
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-208660
record_format	dspace
spelling	sg-nus-scholar.10635-2086602022-12-01T18:01:00Z ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM FANG HANYAN CHEMISTRY Jiong Lu 2D semiconductor, scanning tunneling microscopy, non-contact atomic microscopy, single vacancy, vacancy cluster, domain boundary Ph.D DOCTOR OF PHILOSOPHY (FOS) 2021-11-29T18:00:24Z 2021-11-29T18:00:24Z 2021-04-29 Thesis FANG HANYAN (2021-04-29). ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/208660 0000-0002-1529-2195 en
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	2D semiconductor, scanning tunneling microscopy, non-contact atomic microscopy, single vacancy, vacancy cluster, domain boundary
spellingShingle	2D semiconductor, scanning tunneling microscopy, non-contact atomic microscopy, single vacancy, vacancy cluster, domain boundary FANG HANYAN ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM
description	Ph.D
author2	CHEMISTRY
author_facet	CHEMISTRY FANG HANYAN
format	Theses and Dissertations
author	FANG HANYAN
author_sort	FANG HANYAN
title	ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM
title_short	ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM
title_full	ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM
title_fullStr	ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM
title_full_unstemmed	ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM
title_sort	atomic defects characterization and engineering in 2d semiconductors by stm/nc-afm
publishDate	2021
url	https://scholarbank.nus.edu.sg/handle/10635/208660
_version_	1751548380181430272

ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM

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